Monte Carlo Uncertainty Analysis for Photothermal Radiometry Measurements Using a Curve Fit Process

摘要

Photothermal Radiometry (PTR) has become a popular method to measure thermal properties of layered materials. Much research has been done to determine the capabilities of PTR, but with little uncertainty analysis. This study performs a Monte Carlo uncertainty analysis to quantify uncertainty of film diffusivity and effusivity measurements, presents a sensitivity study for each input parameter, compares linear and logarithmic spacing of data points on frequency scans, and investigates the validity of a 1-D heat transfer assumption.